Comparison between the PSF corrected and non-corrected values of the structural and photometric parameters of the Type-III S0 and E/S0 at 0.2 <z< 0.6 sample. Upper row, from left to right: decimal logarithm of the ratio between the PSF corrected structural parameters and the same parameters measured on the original profile: break radius R_break (kpc), scale-length of the inner profile h_i (kpc), scale-length of the outer profile h_o (kpc). Lower row, from left to right: differences between the PSF corrected structural parameters and the same measured on the original profile: surface brightness at the break radius μ_break (mag arcsec^-2), central surface brightness of the inner profile μ_0,i (mag arcsec^-2), central surface brightness of the outer profile μ_0,o (mag arcsec^-2). The black dashed vertical line represents the ratio or difference where the PSF correction would not have any effect.