Fig. B.2

Left panels: continuum-normalized VIS X-shooter spectrum of Sz 117 in the five regions analyzed with ROTFIT (black full lines) with the best fitting template overplotted (red dotted lines). Right panels: χ2 contour maps in the Teff–log g plane. In each panel, the blue dot indicates the best values of Teff and log g, while the 1σ confidence level is denoted by the thick red contour. The errorbars on Teff and log g are also indicated.
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