Free Access

Fig. B.1


Example of the artifacts (R) produced by the receivers (see Table B.2). Several symmetrical spurious replicas of the real SiO J = 4–3 line appear at both sides of it (equidistant). The intensities of the replicas decrease with the frequency distance to the real feature.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.