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Table 4

Obtained properties from the resulting tailor-made photoionisation models.

Teff log L(Hβ) Radius 12 + log(O/H) log(N/O)
(kK) (erg/s) (pc)

S83* 40 34.15 0.1 8.16 0.95
S98 41 35.02 4.4 8.16 1.06
S127* 37 34.33 0.3 8.29 1.34
S128* 41 34.57 0.7 8.21 1.00
S132* 38 33.02 0.1 8.32 0.98
S156* 36 34.11 0.1 8.26 0.95
S162* 37 33.57 3.0 8.30 0.86
S207 40 34.23 2.0 8.13 1.06
S208 39 33.90 1.7 >8.31 <0.96
S212* 39 34.76 4.1 8.15 1.06
S219 42 33.35 3.7 >7.92 <0.86
S228 40 34.33 1.4 8.23 0.92
S266 42 33.21 0.6 >8.11 <0.78
S270 42 34.53 1.1 >7.72 <0.66
S283 42 33.17 1.0 8.20 1.19

Notes.

(*)

H ii regions with chemical abundances also estimated with the direct method.

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