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Table 1

Fitted crystal parameters for MgSiO3 grains under X-ray irradiation.

Exposure Fluence Lattice parameters Crystal size [Å] Fit error


time [s] [eV cm-2] a [Å] b [Å] c [Å] β [°] ρ [g cm-3] D-Sc W-Hd Rp

Ref.a 9.6270 8.8340 5.1800 108.3400 3.1890
20b 2.42 × 1025 9.6445 8.8264 5.1720 108.7902 3.1995 79.12 74.73 3.01
20 2.42 × 1025 9.6445 8.8264 5.1720 108.7902 3.1995 77.97 72.38 9.67
200 2.42 × 1026 9.6300 8.8049 5.1542 108.6531 3.2206 86.53 89.59 11.24
580 7.01 × 1026 9.6276 8.7907 5.1641 108.7908 3.2231 76.55 76.48 9.06
2380 2.88 × 1027 9.6097 8.8269 5.1636 108.8866 3.2180 77.97 82.91 9.36
2670 3.23 × 1027 9.5725 8.8844 5.1577 109.0414 3.2162 48.93 44.06 14.26

Notes.

(a)

From the Inorganic Crystal Structure Database (ICSD), e.g. Ohashi (1984) for enstatite.

(b)

Single sample of MgSiO3 grains in the capillary substrate. All other samples in Si3N4 windows.

(c)

Debye-Scherrer method.

(d)

Williamson-Hall method.

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