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Home All issues Volume 563 (March 2014) A&A, 563 (2014) A95 Full HTML
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Table 3

Best fit parameters for the reflection fitting.

Simple reflection model
Γ b 2.17 ± 0.01
R in c 1.6 ± 0.1 R g
R break d 7 ± 2 R g
q in e 5.9 ± 0.3
q out f 2.6 ± 0.2
Incl.g 20 ± 8
ξ h 20.8 ± 0.3
F pow i 16.6 ± 0.07 × 10-12 ergs-1cm-2
F ref l
C/d.o.f 383/240
Composite disk model
Γ b 2.13 ± 0.01
Rin, 2 = Rout, 1 n 1.90 ± 0.06 R g
Inclg 41 ± 2
q in o 6 ± 2
ξ in p 89 ± 11
q out q 3.7 ± 0.2
ξ out r 20 ± 1
F pow i 15.9 ± 0.1 × 10-12ergs-1cm-2
F ref l 8.0 ± 0.1 × 10-12ergs-1cm-2
C/d.o.f. 354/240

Notes.

(a)

Xspec syntax: PHABS*(POW+KDBLUR2(REFLIONX)).

(b)

Photon index.

(c)

Disk inner radius.

(d)

Break radius above which the emissivity profile of the disk changes slope.

(e)

Index of the emissivity profile of the disk for r ≤ Rbreak.

(f)

Index of the emissivity profile of the disk for r ≥ Rbreak.

(g)

Disk inclination.

(h)

Disk ionization parameter.

(i)

Unabsorbed flux of the main power law in the 0.5–10 keV band.

(l)

Unabsorbed flux of the reflected power law in the 0.5–10 keV band.

(m)

Xspec syntax: PHABS*(POW+KDBLUR(REFLIONX)+KDBLUR(REFLIONX)).

(n)

Inner radius of the second reflection, which is coupled with the outer radius of the first one.

(o)

Index of the disk emissivity profile for the first reflection.

(p)

Disk ionization parameter for the first reflection.

(q)

Index of the disk emissivity profile for the second reflection.

(r)

Disk ionization parameter for the second reflection.

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