Issue |
A&A
Volume 674, June 2023
|
|
---|---|---|
Article Number | A107 | |
Number of page(s) | 10 | |
Section | Astronomical instrumentation | |
DOI | https://doi.org/10.1051/0004-6361/202346302 | |
Published online | 09 June 2023 |
Joint machine learning and analytic track reconstruction for X-ray polarimetry with gas pixel detectors
1
Istituto Nazionale di Fisica Nucleare, Sezione di Torino,
Via Pietro Giuria 1,
10125
Torino, Italy
e-mail: nicolo.cibrario@unito.it
2
Dipartimento di Fisica, Università degli Studi di Torino,
Via Pietro Giuria 1,
10125
Torino, Italy
3
University of Maryland, Baltimore County,
Baltimore, MD
21250, USA
4
NASA Goddard Space Flight Center,
Greenbelt,
8800 Greenbelt Rd, MD
20771,
USA
5
Center for Research and Exploration in Space Science and Technology, NASA/GSFC,
Greenbelt,
8800 Greenbelt Rd, MD
20771,
USA
6
Department of Radiation Oncology, Netherlands Cancer Institute,
Plesmanlaan 121,
1066 CX
Amsterdam, The Netherlands
7
Istituto Nazionale di Fisica Nucleare, Sezione di Pisa,
Largo B. Pontecorvo 3,
56127
Pisa, Italy
8
Dipartimento di Fisica, Università di Pisa,
Largo B. Pontecorvo 3,
56127
Pisa, Italy
9
Department of Physics and Kavli Institute for Particle Astrophysics and Cosmology, Stanford University,
450 Serra Mall,
Stanford, CA
94305, USA
10
Istituto Nazionale di Fisica Nucleare, Sezione di Napoli, Strada Comunale Cinthia,
80126
Napoli, Italy
Received:
2
March
2023
Accepted:
18
April
2023
We present our study on the reconstruction of photoelectron tracks in gas pixel detectors used for astrophysical X-ray polarimetry. Our work aims to maximize the performance of convolutional neural networks (CNNs) to predict the impact point of incoming X-rays from the image of the photoelectron track. A very high precision in the reconstruction of the impact point position is achieved thanks to the introduction of an artificial sharpening process of the images. We find that providing the CNN-predicted impact point as input to the state-of-the-art analytic analysis improves the modulation factor (~1% at 3 keV and ~6% at 6 keV) and naturally mitigates a subtle effect appearing in polarization measurements of bright extended sources known as “polarization leakage”.
Key words: X-rays: general / instrumentation: polarimeters
© The Authors 2023
Open Access article, published by EDP Sciences, under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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