Experimental N V and Ne VIII low-temperature dielectronic recombination rate coefficients S. Böhm, A. Müller, S. Schippers, W. Shi, M. Fogle, P. Glans, R. Schuch and H. Danared A&A, 437 3 (2005) 1151-1157 Published online: 30 June 2005 DOI: 10.1051/0004-6361:20042500