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Fig. 3.

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Line profiles and measurements of spectroscopic quantities for V767 Cen, illustrating the different character of pulsational variability versus variations in emission features. Top-left panel: Power spectrum determined from measurements of the Si IIIλ4553 line, with black computed from RV measurements, and orange from the EWV/EWR ratio. The strongest peak, marked with a red “x”, is taken to be the dominant pulsation frequency. Top-middle panel: Power spectrum computed from the Hα EWV/EWR measurements using the full line profile (green) and the high-velocity wings (outside v sin i; purple). Top-right panel: Si IIIλ4553 line phased to the dominant pulsation period (with 20 bins in phase). Bottom-right panel: Hα line profiles where the inner set of vertical dotted lines mark ±v sin i, and the outer set marks the limits for the EW calculations. Three remaining left panels, from top to bottom: Si IIIλ4553 RVs, Si IIIλ4553 EWV/EWR measurements, and Hα EWV/EWR measurements. Both the panels for Si IIIλ4553 include the best-fit sinusoid at the frequency marked in the top-left panel. The vertical shaded regions in the bottom three left panels indicate the approximate start of the two clearest mass ejection events.

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