Major element profile of a D-irradiated silicate surface, measured via energy dispersive spectroscopy in TEM. (a) High-angle annular dark-field (HAADF) image of olivine. (b) Element profile of olivine obtained from the green arrow in panel (a). (c) HAADF image of pyroxene. (d) Element profile of pyroxene obtained from the green arrow in panel (c). (e) HAADF image of plagioclase. (f) Element profile of plagioclase obtained from the green arrow in panel (e). The dotted black line in the images to the right (b, d, and e) indicates the boundary of completely amorphous rims, measured from the TEM image shown in Fig. 3.