Microstructural characteristics of D-irradiated silicates as revealed by TEM images: olivine (a), pyroxene (b), and plagioclase (c). The three images to the right of the main TEM images show diffraction patterns from selected white areas. The absence of diffraction spots in the top image of each set indicates the presence of an amorphous rim. The middle image for each silicate features both diffraction rings and blurred spots, suggesting a partial amorphous state. The distinct crystal diffraction pattern in the bottom image of each set represents the crystalline matrix; the zone axis superimposed on the image aligns with [110] in olivine and pyroxene, and [111] in plagioclase.