Fig. 10

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PIAACMC control images obtained during the alignment process. Top row: PIAA M1/M2 alignment with a ZYGO interferometer, which takes measurements during (left) and at the end (right) of the alignment. Bottom row: PSF recorded at the end of the alignment procedure with the ZYGO interferometer (left) and after fine-tuning based on the PSF quality using the science detector (right).
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