Fig. 15.

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Results of the LX − T scaling relation analysis. Left: best-fitting scaling relation model to the soft band (0.5 − 2.0 keV) X-ray luminosity (LX), temperature (T), and redshift (z) measurements of the lightcone sample. The solid red line represents the best-fit line, the red shaded area represents ±1σ uncertainty of the mean of the relation (see first row of μ in Eq. (6)), and the dashed red line represents the intrinsic scatter of the relation (σL|T) around the mean. Right: marginal and joint posterior distributions of the jointly modeled LX − T and T − M500c relations obtained from the second half of the MCMC chains. The red dashed vertical lines indicate the 32nd, 50th, and 68th percentiles, and the contours indicate the 68% and 95% credibility regions.
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