TEM analysis of the impact-induced splash materials deposited on the olivine surface showing two distinctive compositions. Image (a) shows bright-field TEM mapping of Fa₅₀-P75mJ with the splash materials and np-Fe⁰ particles. Images (b)-(d) show the EDS mapping of Fe, Mg, and Si of the area highlighted by the white box in image (a). The splash material shares the same composition as the subsurface materials. Image (e) shows a high-angle annular dark-field (HAADF) TEM image of Fa₁₀₀-M75mJ with the splash and np-Fe⁰ particles. Images (f)-(h) show the EDS mapping of Fe, O, and Si of the area in image (e). The splash material is Si-poor compared to the subsurface materials.