Residual SiO₂ identified in the cross sections of initial olivine grains and in the FIB foils of laser-irradiated olivine. Images (a) Fa₂₉ and (b) Fa₇₁ are the cross sections of initial olivine grains observed by SEM. The residual SiO₂ was embedded in the interior of the olivine and irregular in shape. The boundary between residual SiO₂ and olivine was clear. Images (c) Fa₅₀-P75mJ and (d) Fa₁₀₀-P25mJ are the FIB foils of laser-irradiated olivine samples. White dashed curves outline the altered residual SiO₂ present in part of the observed area by TEM. The residual SiO₂ affected by the laser irradiation showed amorphous morphologies with blurred boundaries with the matrix. The SEM-EDS analyses were conducted using an FEI Scios at 5 kV. The TEM-EDS analyses were performed using a Talos F200S at 200 kV.