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Fig. 1.


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CLV observations and their inversion. Top row: Measured brightness temperature as a function of reference μ, for commissioning data and from the current data set. Middle row: Normalized data set. The solid line shows a third degree fit and the dash-dotted line shows a linear fit up to logμ100 = 0.8. Bottom row: Electron temperature as a function of the reference optical depth, deduced from the inversion of the observations. Model curves from Fontenla et al. (1993) and our results from Paper II are also plotted.

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