Example output of the MRS visibility tool. In order to properly sample the PSF while ensuring all targets in the HR 8799 system remain in view, we choose to use the CH1 extended source (Ext.) 4-point dither pattern, with a -0.′′3 offset along the MRS β axis. The nominal point source (Pt. Src.) 4-point dither pattern would provide better spatial sampling but leave one or more planets outside the FoV for half the observations.