Fig. 3
Top: correlation diagram between the disruption times tdis obtained from direct integrations of ICs in the close neighborhood of (A1), applying a Bulirsch-Stoer (B-S) and a Runge-Kutta (R-K) integrator. Bottom: analogous result for (A3), but comparing B-S and Radau15 integrators. The same numerical precision was set for all the simulations.
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