Table 4
Source count predictions.
XLF | ![]() |
Method | ![]() |
![]() |
---|---|---|---|---|
V14 | 0.0 | Sampled | 0 | 0 |
U14 | 0.2 | Sampled | 0 | 1 |
M15 | 0.4 | Sampled | 0 | 1 |
G15 | 0.2 | Sampled | 0 | 1 |
B15 lower | 0.2 | Nominal | 0 | 1 |
B15 upper | 15.9 | Nominal | 15 | 19 |
A15 | 0.0 | Nominal | 0 | 0 |
Notes. are expected source counts in eFEDS obtained from the integration of various nominal best-fitting XLF models. We also list the 50th and 84.1th percentiles of the distributions of expected Poisson counts in eFEDS (accounting for the XLF fit uncertainties). The investigated intervals are z = 5.7−6.4 and log (L2−10 keV∕(erg s−1)) = 45.5−50. The method indicates whether the 1σ uncertainties on the XLF parameters were accounted for (sampled) or if the nominal model was used (nominal) for the derivation of the percentiles of the count distributions.
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