Table 3.
Variations in the orientation of the S/X band frame depending on the subset of ICRF2 defining sources used to align the frame onto ICRF2.
ICRF2 defining sources |
Rotation of the frame |
|||||
---|---|---|---|---|---|---|
Max | Nb | Nb | % | R1 | R2 | R3 |
SI | excluded | included | included | (μas) | (μas) | (μas) |
5.5 | 0 | 295 | 100 | – | – | – |
4.0 | 1 | 294 | > 99 | −1 | −1 | 4 |
3.5 | 7 | 288 | 98 | −3 | −2 | 4 |
3.25 | 12 | 283 | 96 | −2 | −2 | 6 |
3.0 | 36 | 259 | 88 | −4 | 4 | 4 |
Notes. Each subset results from filtering out the ICRF2 defining sources based on the maximum structure index (SI) value given in column 1. Rotations (in μas) are measured relative to the case where all 295 ICRF2 defining sources are considered for the alignment.
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