Synoptic maps showing FIP bias and EUV emission. Top panel: map of the Si/S First Ionisation Potential (FIP) bias ratio, with predicted ACE solar wind source regions overlain with black circles. Bottom panel: total intensity in the FE XII 195.120 Å line, which lies close to the AIA 193 Å passband shown in Fig. 1. The brighter areas of EUV emission, corresponding to active regions, can be seen to exhibit larger FIP biases.