Ensemble of derived parameters for the final sample of analysed binary systems. Distributions of θ parametervalues for 12 760 analysed objects are shown with diagonal panels, whereas the other panels indicate correlations between these model parameters. The associated uncertainty distributions are displayed in Fig. D.1. For clarity, we show the logarithm (base 10) of values for R1, R2, and E(B−V). The parameter units are given in Table 2.
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