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Fig. 4.


Variance of the detector patterns as shown for a typical 5 × 5-dithering pattern from Fig. 1. For each added pointing we calculate the standard deviation across the 19 Ge detectors, and also consider different ratios of source (right axis) to BG (left axis). For a specific ratio, the variance changes with the number of added pointings to the power of −0.8. Thus, even for strong source contributions, the mask pattern will smear out over the course of one INTEGRAL orbit.

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