Fig. 17.
SXPD patterns for in situ annealed Mg0.9Fe0.1SiO3. Panel A. temperature dependent crystallisation (patterns offset in y-direction). Bottom pattern is at 455°C, top pattern is 995°C, temperature step between displayed scans is 20°C. Panel B: SXPD patterns at the point where crystalline structure is first detected, bottom pattern is at 850°C, top is 995°C, temperature step between displayed scans is 5°C. Panel C: SXPD scan at maximum annealing temperature 995°C showing limited crystalline diffraction.
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