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Fig. 6.

image

First ellipticity component of the spatially varying systematic effects, simulated over a 10 ° ×10° field. Here the effects are normalized to their maximum value for a better visual comparison. From the left, the first panel shows the point spread function pattern used to model PSF leakage (). The second panel shows a regular pattern using the detector chip bias model from OmegaCam multiplied by a factor of 5 (0.001 <  c1 <  0.025). The third panel shows the random correlated noise PSF residual model with a smoothing length similar to the chip size (), while the last panel shows the same systematic for a roughly pointing size smoothing length ().

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