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Fig. 15.


Sensitivity heat maps for each instrument. Redshift uncertainty (colors) are plotted against source redshift (x-axis) and total source counts (y-axis). Above the thick contour lines, IG > 1 bit, i.e., the number of counts is sufficient to provide some redshift information. From left to right panels, the columns show log NH = 22, 23, 24, and 25 cm−2. XMM total source counts refer to total counts across PN/MOS1+2.

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