Fig. 6
Equivalent width (EW) ratios for characteristic lines from ground and metastable levels in Be-like Si xi to C-like Si ix. The assumptions (SED, geometry, column density, turbulence, etc.) of the calculation are described in Sect. 2. For those lines with non-negligible optical depth (τ0 ≳ 1), the exact EWs depend on the line broadening profiles.
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