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Table 3
Distribution of hot column strength for SM/AF/XP devices at 3400 revolutions.
| Dark signal | Number of | Number of |
| ADU | hot columns | affected columns |
|
|
||
| <20 | NA | NA |
| 20−100 | 7 | 16 |
| 100−1000 | 5 | 9 |
| 1000−10 000 | 4 | 4 |
| >10000 | 3 | 3 |
Notes. The centre column contains the number of real hot columns which exhibit increased dark signal, while the right hand column also includes adjacent columns which are indirectly affected via serial CTI or blemish spillover.
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