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Table 2
Metrology variables for data analysis.
| Notation | Name | Absorbed noises |
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| B(t) | Average intensity | Laser flux, |
| offset fluctuations | ||
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| A(t) | Amplitude | Laser flux |
| polar. fluctuations | ||
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| Kx(t) | Metrology wavevector (x proj.) | Laser freq. fluctuation, |
| thermal expansion | ||
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| Ky(t) | Metrology wavevector (y proj.) | Laser freq. fluctuation, |
| thermal expansion | ||
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| φ(t) | Differential phase | Phase jitter (thermal |
| and mechanical) | ||
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| ι(i,j) | Pixel relative intensity | PRNU |
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| α(i,j) | Pixel relative amplitude | PRNU, |
| visibility vs. space | ||
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| δx(i,j) | Pixel offsets (x proj.) | – |
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| δy(i,j) | Pixel offsets (y proj.) | – |
Notes. The last columns gives the types of noises that affect the values of each variable.
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