Comparison of the total [O iii] line width (W₈₀, upper left panel), maximum velocity range (Δv, upper right panel), size of the ENLR (R_int, lower right panel), and the power-law slope of the total [O iii] surface brightness profile (η, lower left panel) from the QSO as measured by Liu et al. (2014) and our re-analysis. We find good agreement between measurements with only a weak systematic offset and a scatter consistent with the intrinsic accuracy of measurements. The surface brightness profile slope η shows the greatest scatter because the actual range of the outer profile to measure η is not clearly specified in Liu et al. (2014), so that our measurements are likely not exactly matching their methodology. For the ENLR we measure the isophotal radius at a surface brightness (corrected for cosmological dimming) of Σ_{[O iii]} = 10^-15 erg s^-1 cm^-2 arcsec^-2 (black circles) and the maximum projected distance to spaxels which exhibit the same threshold surface brightness locally (grey symbols).