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Fig. A.1


Correlation between n*thickness of films (d > 300 nm) vs. the integrated 3.4 μm band area. This is used to estimate n*thickness for the ultra-thin films (d < 100 nm) using their integrated 3.4 μm values. The inset shows the 3.4 μm band of a-C:H films produced with different deposition times.

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