Free Access

Fig. 7

image

Fitted dust (top panel) and (bottom panel) amplitudes (AEE and ABB) at = 80, in μK2 for the 400 deg2 patches as a function of their mean I353. The empirical scaling law, AEE,BBI3531.9, adjusted in amplitude to the data points, is overplotted as a red line. The ± 3σ statistical error on this relation from Monte Carlo simulations of Planck inhomogeneous noise (see Appendix C.1) is represented as a light blue shaded area and the total ± 3σ error, including statistical noise plus Gaussian sample variance, is represented as a light red shaded area. Points are computed for all 352 patches, but we note that, as described in Sect. 3.3.2, the patches overlap and so their properties are not independent.

This figure is made of several images, please see below:

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.