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Fig. B.1


Time series registered during a long duration test of a a Roithner-Lasertechnik APG2C1-760 LED mounted on a DICE source. After 18 days of operations, the flux registered by the NIST photodiode (upper left panel) suddenly increased by almost 2%. Only a fraction of this variation was detected by the internal off-axis control photodiode (upper right panel). The other panels display the timeline of the other quantities monitored by the backend electronics: the LED temperature (middle left panel), the backend board temperature (middle right panel), the LED current (lower right panel), and the board reference tension (lower right). No corresponding glitch can be observed on these quantities.

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