Table B.2
Clustering bias in simulated Herschel images.
| Method | 100 μm | 160 μm | 250 μm | 350 μm | 500 μm |
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| A |
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| B |
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| C |
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Notes. These values were obtained by computing the ratio of measured mean stacked fluxes to the expected mean fluxes in simulated images using our flux extraction method (see Sect. 3.2). Median stacked fluxes are affected the same way, after removing the noise bias described in Appendix B.1. We also show the 16th and 84th percentiles of the bias distribution. The methods are: A, using our own flux extraction procedure Sect. 3.2; B, using the full PSF; and C, using only the central pixel.
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