Parameters of linear fits of the data presented Fig. 17.
|Fit parameters||Slopes ± σmeas.||origin||Slopes ± (σmeas. ⊕ σmodel.)|
|[10-4 pix/ke]||[pix]||[10-4 pix/ke]|
|X–550 nm||4.61 ± 0.17||1.594||0.21 ± 0.23|
|Y–550 nm||5.06 ± 0.18||1.622||0.04 ± 0.20|
|X–900 nm||3.80 ± 0.05||2.042||0.15 ± 0.17|
|Y–900 nm||4.25 ± 0.06||2.048||0.22 ± 0.13|
Notes. For the 550 nm spots, the statistic gives a ≈3.6% relative precision on the X and Y brighter-fatter slopes (first column). For the 900 nm spots, the higher statistic reaches a better relative precision (≈1.5%) on the X and Y brighter-fatter slopes. After the correction (second column), the residual slopes are below 5% of their initial values. It should be pointed out that the amplitude of the residuals are compatible with the expected underestimation introduced by the charge density approximation. It is also found that these residuals are within the 1σ combined uncertainties from the measurements and the uncertainties from the redistribution of charges (except for the Y direction of the 900 nm spots for which it is below 2σ rms.)
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