Upper limit of diffusion variation for CCD E2V-250 illuminated by 550 nm spots and for DECam CCD N17 in r-band.
|Size (μm)||CCD E2V-250||DECam|
|PSF at 100 ke−||16.41||16.74||25.97||29.18|
|Diffusion contribution (%)||3.7||3.4||20.2||20.7|
Notes. The relative difference between the two results is coming from the operating bias voltages (CCD E2V-250 is operated with a ~6 times higher drift field than DECam). The final contribution of the diffusion to the PSF broadening is half its total variation.
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