Planck 2013 results
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Fig. 24


Cumulative distribution N(>E) of long glitches per unit surface area of the wafer for all bolometers used for the scientific analysis. The black solid lines correspond to selected long glitches. The green lines correspond to total glitches, but are representative of long glitches, since they dominate at low energy. We have used a relative calibration of the energy (indicated on the x-axis) such that the cumulative counts for all bolometers match at 103 keV. The absolute calibration of the energy is set so that the faint-end break of the counts matches the expected deposited energy of about 140 keV in the Si die. Nevertheless, we observe that the shape of the cumulative counts match for all detectors, and with a low dispersion. The break in the counts at the faint end is very significantly detected; this is our best indication from flight data that long glitches result from particles hitting the Si die of the bolometer. Dot-dashed and dashed lines correspond to the predicted power-law distributions of deposited energy from protons and helium, respectively, with a toy model for the interaction on the wafer using the incident particle spectrum at L2 for energies significantly higher than the stopping power energies. Predicted minimum deposited energies for He and for protons are indicated with dotted lines. We interpret the second apparent bump (seen as a slight break in the spectrum at around 20 times the energy of the main break) as the signature of He nuclei.

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