Fig. 20
Silicate sputtering yield for incident H+ (dotted lines) and He+ (solid lines) as a function of the impinging energy. Tielens et al. (1994) estimates (black lines) and SRIM calculations (red lines) are shown. The sputtering yield for impinging He+ ions are multiplied by their relative abundance with respect to hydrogen, i.e. XHe = 0.1.
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