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Table 2

Contribution of strong atomic lines to the observed counts in the difference images estimated from the IUE spectra.

Line Wavelength Flux Count fraction in
(Å) 10-15 erg s-1 difference image

Si iva 1388−1409 38 (≲4.5) F140F150: 30% (4%)
C iv 1542−1557 55 (20) F150F165: 18% (9%)
He ii 1634−1646 29 F150F165: 5% (6%)
[O iii] 1657−1669 36 F150F165: 3% (3%)

Notes.Values in brackets are derived from the STIS E140H or GHRS spectra. The filters are abbreviated as F plus cutoff wavelength.

(a)

Includes emission from [O iv].

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