Table 3
Number of spurious sources in the 2 − 10 keV band simulations.
| Exp. | CDFS | Total sim. | W.count. | Spurious | Fract. |
|
|
|||||
| any | 335 | 358 ± 16 | 328 ± 17 | 30 ± 5 | 8.4% |
| ≥ 300 | 302 | 306 ± 15 | 296 ± 15 | 10 ± 3 | 3.3% |
Notes. The column “CDFS” gives the number of sources found in the XMM-CDFS which respect the same selection of the simulations (i.e. extent < 0.5 and no de-blending; see text). The columns “Total sim.”, “W.count.”, “Spurious” give the average and standard deviation of the number of sources per simulation, the number of sources with a counterpart in the input catalogues, and the number of spurious, respectively. The column “Fract.” gives the fraction of spurious sources over the total number. Exposure thresholds are expressed in ks.
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