Fig. 5
Interference data during the thermal annealing experiment on porous ASW grown on a Si substrate, with different heating rates (1, 2, and 4 K min-1). The gray lines represent the raw experimental data, and the black lines are the smoothed data. The inset presents the evolution of the O-H dangling mode during the warm-up of porous ASW from 15 to 120 K.
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