Correlation between the integrated VHE flux and the integrated RXTE (left) and Swift XRT fluxes (right). The labels indicate the dates of observations (MJD - 53 000). The points represent averages over simultaneous time intervals of 10 min (except for the H.E.S.S./RXTE point from MJD 53 949 and the H.E.S.S./XRT point from MJD 53 952 that correspond to a 30 min time window, as well as the H.E.S.S./XRT point from MJD 53 953, corresponding to a 90 min interval). The statistical uncertainties on the logarithmic fluxes are approximated with symmetric error bars. The two lines in each panel show power law fits to subsets of the data: the dashed lines include all “high flux” data, while the fits marked with solid lines include all “high flux” data except for the data from the night of Flare 2 (MJD 53 946).