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Fig. 6


Same as Fig. 5, but for [Si/Fe] vs. [Fe/H]. In the upper panel we compare our results with those of previous LTE analyses: McWilliam et al. (1995, pluses); Ryan et al. (1996, asteriks); Cayrel et al. (2004, open square); Honda et al. (2004, open diamonds); Aoki et al. (2005, filled square). In the lower panel the thick solid lines are 1-σ scatter, the short dashed lines crossing data points represent the fitting slope, and the dashed-dotted lines are the fitting uncertainties.

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