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Fig. 5


A comparison of the SPLOT and DAOSPEC EW measurements for GIRAFFE (right-hand side) and UVES (left-hand side) measurements of the same two stars in Fornax dSph, BL239 (top panels) and BL278 (bottom panels). The solid line shows perfect agreement between the two sets of measurements. As in S03, the dashed lines delineate an  ±6 mÅ offset from this line, and the dotted lines represent a 10% error convolved with this 6 mÅ error. These lines are representative of the errors on SPLOT-based EWs. We indicate in each panel in the upper left-hand corner the mean difference between the UVES and GIRAFFE measurements (mean) and the standard deviation (std). The signal-to-noise ratios (SNR) as given by DAOSPEC for the UVES lower CCD (l,  ~4800–5800 Å), and the upper UVES CCD (u,   ~5800–6800 Å) or the three different orders of the GIRAFFE spectra are given in the bottom right-hand corner of each panel.

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