Issue |
A&A
Volume 418, Number 1, April IV 2004
|
|
---|---|---|
Page(s) | 363 - 369 | |
Section | Atomic, molecular, and nuclear data | |
DOI | https://doi.org/10.1051/0004-6361:20034384 | |
Published online | 02 April 2004 |
Electron impact excitation of fine-structure levels in Cl II*
Department of Physics, Clark Atlanta University, Atlanta, GA 30314, USA
Corresponding author: stayal@cau.edu
Received:
23
September
2003
Accepted:
7
November
2003
The B-spline basis has been used in the R-matrix approach to calculate electron
impact excitation collision strengths for transitions between the
,
and
levels and from these levels to the fine-structure
levels of the excited
,
,
,
and
configurations of Cl II. We considered 23 LS states
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
and
in the close-coupling expansion
that give rise to 51 fine-structure levels. The non-orthogonal orbitals are used for an
accurate representation of both the target wavefunctions and the R-matrix basis functions.
The collision strengths for transitions between fine-structure levels are calculated by
transforming the LS-coupled K-matrices to K-matrices in an intermediate coupling scheme.
The Rydberg series of resonances converging to excited state thresholds make substantial
contributions to collision strengths. The thermally averaged collision strengths have been
obtained by integrating collision strengths over a Maxwellian distribution of electron
energies and these are listed in Table 2 for log T from 3.3 to 5.6 K.
Key words: atomic data / atomic processes / line: formation
© ESO, 2004
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