Experimental N V and Ne VIII low-temperature dielectronic recombination rate coefficientsS. Böhm, A. Müller, S. Schippers, W. Shi, M. Fogle, P. Glans, R. Schuch and H. DanaredA&A, 437 3 (2005) 1151-1157DOI: https://doi.org/10.1051/0004-6361:20042500
