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Experimental O VI dielectronic recombination rate coefficient and its enhancement by external electric fields

S. Böhm, A. Müller, S. Schippers, W. Shi, N. Eklöw, R. Schuch, H. Danared and N. R. Badnell

A&A, 405 3 (2003) 1157-1162

DOI: https://doi.org/10.1051/0004-6361:20030752

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