High resolution soft X-ray spectroscopy of M 87 with the reflection grating spectrometers on 
I. Sakelliou, J. R. Peterson, T. Tamura, F. B. S. Paerels, J. S. Kaastra, E. Belsole, H. Böhringer, G. Branduardi-Raymont, C. Ferrigno, J. W. den Herder, J. Kennea, R. F. Mushotzky, W. T. Vestrand and D. M. Worrall
A&A, 391 3 (2002) 903-909
DOI: https://doi.org/10.1051/0004-6361:20020900
