Challenging interferometric imaging: Machine learning-based source localization from uv-plane observationsO. Taran, O. Bait, M. Dessauges-Zavadsky, T. Holotyak, D. Schaerer and S. VoloshynovskiyA&A, 674 (2023) A161DOI: https://doi.org/10.1051/0004-6361/202245778
