Transient processing and analysis using AMPEL: alert management, photometry, and evaluation of light curves
J. Nordin, V. Brinnel, J. van Santen, M. Bulla, U. Feindt, A. Franckowiak, C. Fremling, A. Gal-Yam, M. Giomi, M. Kowalski, A. Mahabal, N. Miranda, L. Rauch, S. Reusch, M. Rigault, S. Schulze, J. Sollerman, R. Stein, O. Yaron, S. van Velzen and C. Ward
A&A, 631 (2019) A147
DOI: https://doi.org/10.1051/0004-6361/201935634
